👑 Techinical Excellence Bronze Awards

These awards were presented by factory general manager for outstanding technical contribution to the plant.

🔧 NTI Pristine RF Triseca DC Test Solution🔧

Awarded By MD On Q1,2023

➤ Developed State Of th art first pritine load board for NTI Triseca
➤ This innovative board design supported intial reliability qual
➤ Recognized with Top tier Bronze Medal At Factory level

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🔧Delta 1688(PQFN 8x8)DC Test Solution Development Using DMAIC Apporach🔧

Awarded By MD On Q3,2017

➤ Pionered first integration delta and turret handler to new dc test Juno
➤ Reduced conversiion time by 50% and yield improvement of 10%
➤ Recognized with Bornze Medal by GM

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🔧AFT20S015N EOS Elimination Utilizing Poka-Yoke Methodolgy🔧

➤ Pioneerd Test Plan Optimization To Detect Oreintation During Pre Electrical Testing
➤ If unit placed in wrong orientation had writted code auto stop testing without damaging the units
➤ Highest Award Whole Company-Bronze Awards

Awarded By MD On Q3,2015

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🔧New DC Tester Interface Design And Development For TO Platform🔧

➤ Pioneerd DC load board desing all device in TO platform for new Juno tester
➤ Multiple recognition for significant technical contribution to factory
➤ Highest Award Whole Company-Bronze Awards

warded By MD On Q4,2015

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🔧Gross Margin Improvement On 2Ghz RFIC Devices🔧

➤ Used PDCA approach to exnorate all the possbile root by work flow
➤ Had narrowed down root cause trim machine and implmented ionizer to eliminate esd damage
➤ Highest Award Whole Company-Bronze Awards

Awarded By MD On Q4,2013

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🔧KLM Wire Bond Quality Metrics Improvement🔧

➤ Led team of wire bond process engineers across factory to reduce customer quality complaints
➤ Led consecutively 5 years to bring down Customer Quality incideny by 50%
➤ Highest Award Whole Company-Bronze Awards

Awarded By MD On Q2,2013

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🔧Error Proof DC Load Board Design Solution For RF Plastic Packages🔧

➤ Brainstormed solution for shorted adjacent lead due to mix leadframes at aasembly
➤ Had design in hardware and software solution detect mix device effectively
➤ Highest Award Whole Company-Bronze Awards

Awarded By MD On Q4,2011

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🔧Elimination Of Test Fault-Grading Escapees-MD7IC2050N🔧

➤ Brainstormed solution for test escapes for ruptured DC blocking cap due to test coverage issues
➤ Had design in load board solution and writted 8D report to customer for permanent fix
➤ Highest Award Whole Company-Bronze Awards

Awarded By MD On Q3,2010

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🔧L15 DC Test Yield Improvement Thru DMADV Appprach🔧

➤ Low test yield test acuuracy iseues
➤ Design in load board solution to match probe Wafet test resuts
➤ Highest Award Whole Company-Bronze Awards+ Sig Sigma Blackbelt

Awarded By MD On Q3,2010

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🔧M52A Yiled Improvemnt🔧

➤ Low test yield issues after data analysis sowed probe control nitride thicknes SPC was out by 15%
➤ Had hilited wafer probe in Chandler and control was put back and yiled improved >99%
➤ Highest Award Whole Company-Bronze Awards

Awarded By MD On Q3,2010

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🔧Test Time Reduction For RFIC Platform Using DMAIC Approach🔧

➤ Long test time affects output and used Dmaic approch to reduce test time.
➤ 50% test time reduced and increased output
➤ Highest Award Whole Company-Bronze Awards

Awarded By MD On Q4,2006

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🔧Fool Proof RFIC Ciecuit Protection Through Software Development Using DMAIC Approach🔧

➤High burnt circuit reported disrupt output.
➤Developed low voltage current limited test to prevent burnt circuits
➤ Highest Award Whole Company-Bronze Awards

Awarded By MD On Q4,2006

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🔧MW4IC2230 Oscillation Issues🔧

➤Customer reported RF board level oscillation.
➤Simulated RF application board simulation using ADS software.
➤Highest Award Whole Company-Bronze Awards

Awarded By MD On Q4,2004

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🔧 HPA Next Generation Module Development🔧

➤Largest Module Developemnt in PA Platform.
➤Led test equipment and test plan readyness.
➤ Highest Award Whole Company-Bronze Awards

Awarded By MD On Q4,2003

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